TomographySelected Publications

Fei-Hu Du, Ling Zhang, Yun-Cheng Tang, Shang-Qi Li, Yu Huang, Le Dong, Qianqian Li, Hong Liu, Dong Wang, Yong Wang. “Low-Temperature Synthesis of Amorphous Silicon and Its Ball-in-Ball Hollow Nanospheres as High-Performance Anodes for Sodium-Ion Batteries,” Advanced Materials Interfaces (2022) Abstract
Philipp Grosse, Aram Yoon, Clara Rettenmaier, Antonia Herzog, See Wee Chee & Beatriz Roldan Cuenya. “Dynamic transformation of cubic copper catalysts during CO2 electroreduction and its impact on catalytic selectivity,” Nature Communications (2021) Abstract
X. Zhou, J. R. Mianroodi, A. Kwiatkowski da Silva1, T. Koenig, G. B. Thompson, P. Shanthraj, D. Ponge, B. Gault, B. Svendsen, D. Raabe. “The hidden structure dependence of the chemical life of dislocations,” Science Advances, (2021) Abstract
Thomas F. Kelly, David J. Larson, Keith Thompson, Roger L. Alvis, Joseph H. Bunton, Jesse D. Olson, and Brian P. Gorman. “Atom Probe Tomography of Electronic Materials,” Nature Communications, (2021) Abstract
Yuan Hung Lo, Jihan Zhou, Arjun Rana, Drew Morrill, Christian Gentry, Bjoern Enders, Young-Sang Yu, Chang-Yu Suni, David A. Shapiro, Roger W. Falcone, Henry C. Kapteyn, Margaret M. Murnane, Pupa U. P. A. Gilbert, and Jianwei Miao. “X-ray linear dichroic ptychography,” Proceedings of the National Academy of Sciences, (2021)​ Abstract
Jing Guo, Xingxu Yan, Mingjie Xu, Govinda Ghimire, Xiaoqing Pan, and Jin He,. “Effective Electrochemical Modulation of SERS Intensity Assisted by Core–Shell Nanoparticles,” Analytical Chemistry, (2021)​ Abstract
Xiaolei Chu, Hamed Heidari, Alex Abelson, Davis Unruh, Chase Hansen, Caroline Qian, Gergely Zimanyi, Matt Law, and Adam J. Moulé. “Structural characterization of a polycrystalline epitaxially-fused colloidal quantum dot superlattice by electron tomography,” Journal of Materials Chemistry A (2020) Abstract
Chilan Ngo, Margaret A. Fitzgerald, Michael J. Dzara, Matthew B. Strand, David R. Diercks, and Svitlana Pylypenko. “3D Atomic Understanding of Functionalized Carbon Nanostructures for Energy Applications,” ACS Applied Nano Materials (2020) Abstract
Zack Gainsworth, Peter Ercius, Karen Bustillo, Anna L. Butterworth, Christine E. Jilly-Rehak, and Andrew J. Westphal. “STEM/EDS Tomography of Cometary Dust,” Microscopy and Microanalysis (2019) Abstract
Brian P. Gorman, David Diercks, Norman Salmon, Eric Stach, Gonzalo Amador, and Cheryl Hartfield. “Hardware and Techniques for Cross-Correlative TEM and Atom Probe Analysis,” Microscopy Today (2008) Abstract
Surya S. Rout, Philipp R. Heck, Nestor J. Zaluzec, Dieter Isheim, Dean J. Miller, and David N. Seidman. “Adhesive-Based Atom Probe Sample Preparation,” Microscopy Today (2018) Abstract
Surya S. Rout, Philipp R. Heck, Dieter Isheim, Thomas Stephan, Nestor J. Zaluzec, Dean J. Miller, Andrew M. Davis, and David N. Seid. “Atom-probe tomography and transmission electron microscopy of the kamacite–taenite interface in the fast-cooled Bristol IVA iron meteorite,” Meteoritics & Planetary Science (2017) Abstract
Peter Bai, Sui Yang, Wei Bao, Joseph Kao, Kari Thorkelsson, Miquel Salmeron, Xiang Zhang, and Ting Xu. “Diversifying Nanoparticle Assemblies in Supramolecule Nanocomposites Via Cylindrical Confinement,” Nano Letters (2017) Abstract
T. Segal-Peretz, J. Winterstein, J. Ren, M. Biswas, J.A. Liddle, J.W. Elam, L.E. Ocola, R.N. S. Divan, N. Zaluzec, and P.F. Nealey.  “Metrology of DSA process using TEM tomography,” Proc. SPIE (2015)  Abstract
T. Segal-Peretz, J. Winterstein, M. Biswas, J.A. Liddle, Jeffrey W. Elam, N. J. Zaluzec, P.F. Nealey.  “Staining Block Copolymers using Sequential Infiltration Synthesis for High Contrast Imaging and STEM tomography,” Microscopy and Microanalysis (2015).  Abstract
S. Zhang, A. Petford-Long, C. Phatak. “Three-Dimensional Magnetic Field Reconstruction of Artificial Skyrmion Hetrostructures,” Microscopy and Microanalysis (2015)  Abstract
A. Stokes, M. Al-Jassim, D. Diercks, B. Gorman, B. Egaas, and Brian Gorman.  “Targeting Grain Boundaries for Structural and Chemical Analysis Using Correlative EBSD, TEM, and APT,” Microscopy & Microanalysis (2015)  Abstract
A. K. Shukla, P. Ercius, A. R. S. Gautam, J. Cabana, and U. Dahmen “Electron Tomography Analysis of Reaction Path during Formation of Nanoporous NiO by Solid State Decomposition.” Crystal Growth & Design (2014) Abstract
M. Ge, Y. Lu, P. Ercius, J. Rong, X. Fang, M. Mecklenburg, and C. Zhou “Large-Scale Fabrication, 3D Tomography, and Lithium-Ion Battery Application of Porous Silicon” Nano Letters (2014) Abstract
A. Devaraj, S. Nag, R. Banerjee. “Alpha Phase Precipitation from Phase-separated Beta Phase in a Model Ti–Mo–Al Alloy Studied by Direct Coupling of Transmission Electron Microscopy and Atom Probe Tomography,” Scripta Materialia (2013) Abstract
J. Wu, S. Padalkar, S. Xie, E.R. Hemesath, J. Cheng, G. Liu, A. Yan, J.G. Connell, E. Nakazawa, X. Zhang, L.J. Lauhon, V.P. Dravid. “Electron Tomography of Au-Catalyzed Semiconductor Nanowires,” J. Phys. Chem. C (2013) Abstract
F. I. Allen, P. Ercius, M. A. Modestino, R. A. Segalman, N. P. Balsara, A. M. Minor “Deciphering the three-dimensional morphology of free-standing block copolymer thin films by transmission electron microscopy.” Micron (2013) Abstract
J. Kao, P. Bai, V. P. Chuang, Z. Jiang, P. Ercius, and T. Xu “Nanoparticle Assemblies in Thin Films of Supramolecular Nanocomposites” Nano Letters (2012)
Y. Liu, D.K. Schreiber, A.K. Petford-Long, K.Z. Gao. “Three-Dimensional Characterization of Near-Field Transducers by Electron Tomography,” Materials Characterization (2012) Abstract
Kari Thorkelsson, Alexander J. Mastroianni, Peter Ercius, and Ting Xu “Direct Nanorod Assembly Using Block Copolymer-Based Supramolecules” Nano Letters (2012) Abstract
S. Yakovlev, X. Wang, P. Ercius, N. P. Balsara, and K. H. Downing “Direct Imaging of Nanoscale Acidic Clusters in a Polymer Electrolyte Membrane.” Journal of the American Chemical Society (2011)
C. Phatak, A.K. Petford-Long, M. De Graef. “Three-Dimensional Study of the Vector Potential of Magnetic Structures,” Physical Review Letters (2010) Abstract
B.P. Gorman, D. Diercks, N. Salmon, E. Stach, G. Amador, C. Hartfield. “Hardware and Techniques for Cross-Correlative TEM and Atom Probe Analysis,” Microscopy Today (2008)  Article
T.F. Kelly, D.J. Larson, K. Thompson, R.L. Alvis, J.H. Bunton, J.D. Olson, and B.P. Gorman. “Atom Probe Tomography of Electronic Materials,”Annual Review of Materials Research (2007) Abstract