Hummingbird Scientific Electrical Biasing TEM Holder with wirebonded 6-pin chip


Technical Specs

TEM Sample Holder - Electrical Biasing - FEI Model
  1600 Series
Tilt Range ±45° depending on microscope and pole piece
Number of Electrical Contacts 6, 8, or 9 *
Contact Type Flexible wirebond contacts or fixed spring contact
Carrier Removable Sample Carrier
Carrier Compatibility Any Standard TEM Sample Supports
Sample Size Fits up to 3 x 6mm samples
Wiring Standard or low-noise shielded
TEM Compatibility TFS/FEI, JEOL, Hitachi, Zeiss

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Featured Research

Temperature mapping on the nanoscale

Microelectronic devices can be simultaneously seen and tested with a biasing holder—taking advantage of the TEM’s analytical toolbox, like in this example, where the in-situ TEM biasing holder and EELS are used to capture changes in temperature. A team led by UCLA demonstrate a noncontact thermometric technique to measure bulk temperatures with nanometer-scale spatial resolution using plasmons.

Reference:  B.C. Regan et al. Nanoscale temperature mapping in operating microelectronic devices. Science (2015). Abstract

Copyright © 2016 by the American Association for the Advancement of Science


Joule heating and EELS spectrum of Al device. Image copyright © 2016 by the American Association for the Advancement of Science

Video Spotlight

Using our electrical biasing holder, researchers at Penn State have demonstrated the room temperature dislocation-based plasticity and tremendous flaw tolerance of TiN film, which in bulk form is a brittle material. TiN loading was conducted using a MEMS device containing electro-thermal actuators. The researchers surmise that room-temperature dislocation activities resulted from the nucleation of pre-existing dislocations, which resulted from residual compressive stresses developed during deposition. As a result, the TiN films were tougher than the Ti films in the tested multilayers. The movie shows the dislocation movement at the crack tip following loading at room temperature.

Reference: S. Kumar, D.E. Wolfe, M.A Haque. “Dislocation shielding and flaw tolerance in titanium nitride,” International Journal of Plasticity 27:5 (2011) pp. 739–747 . Abstract

Movie copyright © 2010, Elsevier Ltd.  All rights reserved.

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Selected Publications

Saurabh Gupta, Sandra Stangebye, Katherine Jungjohann, Brad Boyce, Ting Zhu, Josh Kachera, and Olivier N. Pierron. “In situ TEM measurement of activation volume in ultrafine grained gold,” Nanoscale (2020) Abstract
William A. Hubbard, Matthew Mecklenburg, Jared J. Lodico, Yueyun Chen, Xin Yi Ling, Roshni Patil, W. Andrew Kessel, Graydon J. K. Flatt, Ho Leung Chan, Bozo Vareskic, Gurleen Bal, Brian Zutter, and B. C. Regan. “Electron-Transparent Thermoelectric Coolers Demonstrated with Nanoparticle and Condensation Thermometry,” ACS Nano (2020) Abstract
Paul Masih Das and Marija Drndić, “In Situ 2D MoS2 Field-Effect Transistors with an Electron Beam Gate,” ACS Nano (2020) Abstract
June W. Lau, Karl B. Schliep, Michael B. Katz, Vikrant J. Gokhale, Jason J. Gorman, Chunguang Jing, Ao Liu, Yubin Zhao, Eric Montgomery, Hyeokmin Choe, Wade Rush, Alexei Kanareykin, Xuewen Fu, and Yimei Zhu, “Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements,” Review of Scientific Instruments (2020) Abstract
Brian Zutter, Hyunseok Kim, William Hubbard, Dingkun Ren, Matthew Mecklenburg, Diana Huffaker, and B. C. Regan. Mapping Charge Recombination and the Effect of Point Defect Insertion in Gallium Arsenide Nanowire Heterojunctions., arXiv:2010.05140 (2020) Abstract
M. Mecklenburg, W. Hubbard, J. Lodico, and B.C. Regan. “Electron beam-induced current imaging with two-angstrom resolution,” Ultramicroscopy (2019) Abstract
W. Hubbard, Z. Lingley, J. Theiss, S. Sitzman, T. Ayvazian, M. Brodie, and B. Foran. “Scanning transmission electron microscope mapping of electronic transport in polycrystalline BaTiO3 ceramic capacitors, Applied Physics Letters (2019) Abstract
MJ. Lodico, M. Mecklenburg, H. Chan, W. Hubbard, and B.C. Regan. “STEM of a Single Crystal Lithium Ion Battery Anode during Electrochemical Cycling., Microscopy and Microanalysis (2019) Abstract
Zahabul Islam, Aman Haque, and Nicholas Glavin, “Real-time visualization of GaN/AlGaN high electron mobility transistor failure at off-state,” Applied Physics Letters (2018) Abstract
Jared J. Lodico, William A. Hubbard and B. C. Regan. “Scanning TEM Electron Beam Induced Current Imaging in Water.” Microscopy & Microanalysis (2018) Abstract
W. Hubbard, J. Lodico, B. Zutter, D. Shapiro, Y. Lo, A. Rana, D. Morrill, C. Gentry, H. Chan, B.C. Regan. “Total Electron Yield Mapping of Electronic Devide Features via Measurement of X-Ray Beam Induced Currents,” Microscopy and Microanalysis (2019) Abstract
J. Rodriguez-Manzo, Z. Qi, A. Crook, J. Ahn, A. Johnson, M.Drndic. “In Situ Transmission Electron Microscopy Modulation of Transport in Graphene Nanoribbons.” ACS Nano (2016) Abstract
W. Parkin, A. Balan, L. Liang, P. Das, M. Lamparski, C. Naylor, J. Rodriguez-Manzo, A. Johnson, V. Meunier, M. Drndic. “Raman Shifts in Electron-Irradiated Monolayer MoS2.” ACS Nano (2016) Abstract
Edward R. White, Jared J. Lodico & B. C. Regan. “Intercalation events visualized in single microcrystals of graphite,” Nature Communications (2017) Abstract
Nathanael Jöhrmann, Steffen Hartmann, Kiran Jacob, Jens Bonitz, Kathrine E. MacArthur, Sascha Hermann, Stefan E. Schulz, Bernhard Wunderle. “A test device for in situ TEM investigations on failure behaviour of carbon nanotubes embedded in metals under tensile load,” 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (2017) Abstract
J.J. Lodico, E.R. White, W.A. Hubbard, E. Garcia, B. Parks, B. Zutter, B.C. Regan. In-Situ Scanning Transmission Electron Microscopy (STEM) of Individual Electrochemical Intercalation Events in Graphite,” Microscopy and Microanalysis (2015)  Abstract
M.L. Taheri. Toward Deterministic Switching in Ferroelectric Systems: Insight Gained from In-Situ TEM,” Microscopy and Microanalysis (2015)   Abstract
M.-S. Hsiao, Y. Yuan, C. Grabowski, A. Nie, R. Shabazian-Yassar, L.F. Drummy.In-Situ TEM Characterization of Nanostructured Dielectrics,” Microscopy and Microanalysis (2015)   Abstract
J. Hart, M. Jablonski, A. Lang, A. Damadoran, S. Liu, M. Arredondo, L. Martin, A. Rappe, M.L. Taheri.”Toward Deterministic Switching in Ferroelectric Systems: Insight Gained from In Situ TEM,”Microscopy and Microanalysis (2015)   Abstract
W.A. Hubbard, E.R. White, A. Kerelsky, G. Jasmin, J. Lodico. Time-Resolved Imaging of Electrochemical Switching in Nanoscale Resistive Memory Elements,” Microscopy and Microanalysis (2015)   Abstract
B.C. Regan, W.A. Hubbard, E.R. White, R. Dhall, S.B. Cronin, S. Aloni, M. Mecklenburg. Introduction to Plasmon Energy Expansion Thermometry,” Microscopy and Microanalysis (2015)  Abstract
M.H. Mecklenburg, W.A. Hubbard, E.R. White, R. Dhall, S. Cronin, S. Aloni, B.C. Regan. Applications of Plasmon Energy Expansion Thermometry,” Microscopy and Microanalysis (2015)  Abstract
M. Mecklenburg, W. A. Hubbard,E. R. White, Rohan Dhall, S. B. Cronin, S. Aloni, and B. C. ReganNanoscale temperature mapping in operating microelectronic devices, Science (2015) Abstract
M. Puster, J.A. Rodríguez-Manzo, A. Balan, M. Drndić. “Toward Sensitive Graphene Nanoribbon-Nanopore Devices by Preventing Electron Beam-Induced Damage,” ACS Nano (2013) Abstract
E. Hosseinan, O.N. Pierron, Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films,” Nanoscale (2013) Abstract
C.R. Winkler, M.L. Jablonski, A.R. Damodaran, K. Jambunathan, L.W. Martin, M.L. Taheri. Accessing Intermediate Ferroelectric Switching Regimes With Time-Resolved Transmission Electron Microscopy, Journal of Applied Physics (2012) Abstract
C.R. Winkler, A.R. Damodaran, J. Karthik, L.W. Martin, M.L. Taheri. Direct Observation of Ferroelectric Domain Switching in Varying Electric Field Regimes Using In-Situ TEM,” Micron (2012) Abstract
Y. Inayoshi, H. Minoda, Y. Arai, K. Nagayama. “Direct Observation of Biological Molecules in Liquid by Environmental Phase-Plate Transmission Electron Microscopy,” Micron (2012) Abstract
S. Kumar, D.E. Wolfe, M.A. Haque. “Dislocation Shielding and Flaw Tolerance in Titanium Nitride,” International Journal of Plasticity (2011) Abstract
S. Kumar, D. Zhuo, D.E. Wolfe, A. Eades, M.A. Haque. “Length-Scale Effects on Fracture of Multilayers,” Scripta Materialia (2010) Abstract
C.M. Wang, W. Xu, J. Liu, D.W. Choi, B. Arey, L.V. Saraf, J.G. Zhang, Z.G. Yang, S. Thevuthasan, D.R. Baer, N. Salmon. “In-situ transmission electron microscopy and spectroscopy studies of interfaces in Li ion batteries: Challenges and opportunities,” Journal of Materials Research(2010) Abstract
S. Kumar, M.A. Haque. “Fracture Testing of Nanoscale Thin Films inside the Transmission Electron Microscope,” International Journal of Applied Mechanics (2010) Abstract
D.T. Schoen, S. Meister, H. Peng, C. Chan, Y. Yangb, Y. Cuia. “Phase transformations in one-dimensional materials: applications in electronics and energy sciences,” Journal of Materials Chemistry (2009) Abstract
H. Minoda, K. Hatano, H. Yazawa. “Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope,” Review of Scientific Instruments  (2009) Abstract
S. Kumar, M.A. Haque, H. Gao. “Notch-Insensitive Fracture in Nanoscale Thin Films,” Applied Physics Letters (2009) Abstract
S. Meister, D.T. Schoen, M.A. Topinka, A.M. Minor, Y. Cui.  ”Void Formation Induced Electrical Switching in Phase-Change Nanowires,”Nano Letters (2008) Abstract
H. Peng, C. Xie, D.T. Schoen, and Y. Cui. “Large Anisotropy of Electrical Properties in Layer-Structured In2Se3 Nanowires,” Nano Letters (2008) Abstract


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