Hummingbird Scientific’s single-tilt tomography TEM holder with removable sample clamp tips are designed to maximize tilt and allow cross-platform transfers and imaging. Because the system permits unusually high tilt angles, the sample itself is the only contributor to the missing wedge. A range of removable tips are available for the system and can be customized for specific specimen support geometries.
- 3D reconstruction of nanostructures and embedded structures (e.g. dislocations)
- Correlative comparisons between TEM and atom probe tomography
- 3D reconstruction of embedded biological specimens
Single Point Tip
A dedicated sample holder for needle samples.
1mm Grid Tip
Clamps a 1mm TEM sample for high-tilt tomography applications in narrow, gap-objective lens microscopes
3mm Full Grid Tip
Clamps a standard 3mm TEM sample with minimal shadowing at high alpha-tilt angles.
3mm Half Grid Tip
Specifically designed for holding TEM half grids. The sample clamp itself does not shadow the sample.
Atom Probe Tomography Workflow
One sample on one tip: using our TEM tomography holder system in combination with a Focus Ion Beam (FIB) and Atom Probe (AP), researchers have a comprehensive, cross-correlative view for 3D sample reconstruction at the atomic and nano scale. The sample is first sectioned out to the required size and shape using the FIB. The sample can then be left on the same tip and transferred to the TEM for final shape verification and tilt-series acquisition before being placed in the Atom Probe for final analysis.Edit
Cylindrical confinement used as a self assembly technique for nanoparticles
Direct assembly of nanosized building blocks into a functional entity has been a great challenge, especially for DNA templating, which requires aqueous solution. Here, researchers from the University of California, Berkeley and Lawrence Berkeley National Lab were able to use Hummingbird Scientific’s Tomography holder to observe 3D cylindrical confinement of nanoparticles and their self-assemblies into stacked rings and single and double helices.
Reference: Ting Xu et al. Diversifying Nanoparticle Assemblies in Supramolecule Nanocomposites Via Cylindrical Confinement. Nano Letters (2017). Abstract
Copyright © 2017 American Chemical SocietyEdit
3D analysis of Au nanoparticle helical assembly. Image copyright © 2017 American Chemical Society
Tilt series Z-contrast STEM images of a Ge nanowire after alignment into a rotation projection, taken using Hummingbird Scientific’s Tomography holder. The nano-wire is approximately 150nm in diameter and it shows positioning of a gold nano-particle on the wire.
Reference: J. Wu, S. Padalkar, S. Xie, E.R. Hemesath, J. Cheng, G. Liu, A. Yan, J.G. Connell, E. Nakazawa, X. Zhang, L.J. Lauhon, V.P. Dravid. “Electron Tomography of Au-Catalyzed Semiconductor Nanowires,” Journal of Physical Chemistry C 117:2 (2013) pp.1059‒1063. Abstract
Copyright © 2012, American Chemical SocietyEdit
Customization & Service
|Xiaolei Chu, Hamed Heidari, Alex Abelson, Davis Unruh, Chase Hansen, Caroline Qian, Gergely Zimanyi, Matt Law, and Adam J. Moulé. “Structural characterization of a polycrystalline epitaxially-fused colloidal quantum dot superlattice by electron tomography,” Journal of Materials Chemistry A (2020)||Abstract|
|Chilan Ngo, Margaret A. Fitzgerald, Michael J. Dzara, Matthew B. Strand, David R. Diercks, and Svitlana Pylypenko. “3D Atomic Understanding of Functionalized Carbon Nanostructures for Energy Applications,” ACS Applied Nano Materials (2020)||Abstract|
|Zack Gainsworth, Peter Ercius, Karen Bustillo, Anna L. Butterworth, Christine E. Jilly-Rehak, and Andrew J. Westphal. “STEM/EDS Tomography of Cometary Dust,” Microscopy and Microanalysis (2019)||Abstract|
|Brian P. Gorman, David Diercks, Norman Salmon, Eric Stach, Gonzalo Amador, and Cheryl Hartfield. “Hardware and Techniques for Cross-Correlative TEM and Atom Probe Analysis,” Microscopy Today (2008)||Abstract|
|Surya S. Rout, Philipp R. Heck, Nestor J. Zaluzec, Dieter Isheim, Dean J. Miller, and David N. Seidman. “Adhesive-Based Atom Probe Sample Preparation,” Microscopy Today (2018)||Abstract|
|Surya S. Rout, Philipp R. Heck, Dieter Isheim, Thomas Stephan, Nestor J. Zaluzec, Dean J. Miller, Andrew M. Davis, and David N. Seid. “Atom-probe tomography and transmission electron microscopy of the kamacite–taenite interface in the fast-cooled Bristol IVA iron meteorite,” Meteoritics & Planetary Science (2017)||Abstract|
|Peter Bai, Sui Yang, Wei Bao, Joseph Kao, Kari Thorkelsson, Miquel Salmeron, Xiang Zhang, and Ting Xu. “Diversifying Nanoparticle Assemblies in Supramolecule Nanocomposites Via Cylindrical Confinement,” Nano Letters (2017)||Abstract|
|T. Segal-Peretz, J. Winterstein, J. Ren, M. Biswas, J.A. Liddle, J.W. Elam, L.E. Ocola, R.N. S. Divan, N. Zaluzec, and P.F. Nealey. “Metrology of DSA process using TEM tomography,” Proc. SPIE (2015)||Abstract|
|T. Segal-Peretz, J. Winterstein, M. Biswas, J.A. Liddle, Jeffrey W. Elam, N. J. Zaluzec, P.F. Nealey. “Staining Block Copolymers using Sequential Infiltration Synthesis for High Contrast Imaging and STEM tomography,” Microscopy and Microanalysis (2015).||Abstract|
|S. Zhang, A. Petford-Long, C. Phatak. “Three-Dimensional Magnetic Field Reconstruction of Artificial Skyrmion Hetrostructures,” Microscopy and Microanalysis (2015)||Abstract|
|A. Stokes, M. Al-Jassim, D. Diercks, B. Gorman, B. Egaas, and Brian Gorman. “Targeting Grain Boundaries for Structural and Chemical Analysis Using Correlative EBSD, TEM, and APT,” Microscopy & Microanalysis (2015)||Abstract|
|A. K. Shukla, P. Ercius, A. R. S. Gautam, J. Cabana, and U. Dahmen “Electron Tomography Analysis of Reaction Path during Formation of Nanoporous NiO by Solid State Decomposition.” Crystal Growth & Design (2014)||Abstract|
|M. Ge, Y. Lu, P. Ercius, J. Rong, X. Fang, M. Mecklenburg, and C. Zhou “Large-Scale Fabrication, 3D Tomography, and Lithium-Ion Battery Application of Porous Silicon” Nano Letters (2014)||Abstract|
|A. Devaraj, S. Nag, R. Banerjee. “Alpha Phase Precipitation from Phase-separated Beta Phase in a Model Ti–Mo–Al Alloy Studied by Direct Coupling of Transmission Electron Microscopy and Atom Probe Tomography,” Scripta Materialia (2013)||Abstract|
|J. Wu, S. Padalkar, S. Xie, E.R. Hemesath, J. Cheng, G. Liu, A. Yan, J.G. Connell, E. Nakazawa, X. Zhang, L.J. Lauhon, V.P. Dravid. “Electron Tomography of Au-Catalyzed Semiconductor Nanowires,” J. Phys. Chem. C (2013)||Abstract|
|F. I. Allen, P. Ercius, M. A. Modestino, R. A. Segalman, N. P. Balsara, A. M. Minor “Deciphering the three-dimensional morphology of free-standing block copolymer thin films by transmission electron microscopy.” Micron (2013)||Abstract|
J. Kao, P. Bai, V. P. Chuang, Z. Jiang, P. Ercius, and T. Xu “Nanoparticle Assemblies in Thin Films of Supramolecular Nanocomposites” Nano Letters (2012)
|Y. Liu, D.K. Schreiber, A.K. Petford-Long, K.Z. Gao. “Three-Dimensional Characterization of Near-Field Transducers by Electron Tomography,” Materials Characterization (2012)||Abstract|
|Kari Thorkelsson, Alexander J. Mastroianni, Peter Ercius, and Ting Xu “Direct Nanorod Assembly Using Block Copolymer-Based Supramolecules” Nano Letters (2012)||Abstract|
S. Yakovlev, X. Wang, P. Ercius, N. P. Balsara, and K. H. Downing “Direct Imaging of Nanoscale Acidic Clusters in a Polymer Electrolyte Membrane.” Journal of the American Chemical Society (2011)
|C. Phatak, A.K. Petford-Long, M. De Graef. “Three-Dimensional Study of the Vector Potential of Magnetic Structures,” Physical Review Letters (2010)||Abstract|
|B.P. Gorman, D. Diercks, N. Salmon, E. Stach, G. Amador, C. Hartfield. “Hardware and Techniques for Cross-Correlative TEM and Atom Probe Analysis,” Microscopy Today (2008)||Article|
|T.F. Kelly, D.J. Larson, K. Thompson, R.L. Alvis, J.H. Bunton, J.D. Olson, and B.P. Gorman. “Atom Probe Tomography of Electronic Materials,”Annual Review of Materials Research (2007)||Abstract|