Biasing Manipulator
| 1800 Series | |
| Coarse Movement Range |
|
| X axis |
> 1000 µm |
| Y and Z axes |
500 – 1000 µm |
| Fine Movement Range | |
| X axis | 2 – 3 µm |
| Y and Z axes | ~ 40 µm |
| Electrical Contacts | 2 standard (3 – 7)* |
| Current Resolution | 100 pA standard (< 10 pA)* |
| Sample Compatibility | 3 mm half grids, FIB lift-out grids, or custom* |
| TEM Compatibility | TFS/FEI, JEOL |
*Contact us for optional availability and custom configurations
Overview
Hummingbird Scientific’s in-situ TEM Nano-Manipulator Sample Holder features:
- Mobile probe for electrical contacts
- Probe’s uncoupled coarse and fine movements along X, Y, and Z axes
- Easy probe exchange
- Removable sample cartridge
- Integrated voltage source meter and piezoelectric controller
- Intuitive graphical user interface
How it Works
Correlate the structure and chemistry of a sample (HRTEM, electron diffraction, EELS, etc.) with its electrical properties.
Manipulate the mobile biasing probe with high spatial resolution to make electrical contacts.
Control—uncoupled—coarse and fine movements along the X, Y, and Z axes. Coarse movements are actuated with thumb-screws. Fine movements are actuated with a piezoelectric controlled with the included controller and graphical user interface.
Take low noise electrical data with individual coax cables.
Use standard 3 mm half grid samples or FIB lift-out grids to prepare your samples.
Edit
Characterize Electrical Contacts
Use the full battery of TEM-based characterization techniques to record the structure and chemistry of biased electrical contacts. The wide opening area at the contact between mobile probe and sample is compatible with—and optimal for:
- High-resolution TEM imaging
- High-resolution STEM imaging
- Electron diffraction
- Energy dispersive x-ray spectroscopy (EDS)
- Electron energy loss spectroscopy (EELS)
The example shows a TEM image of a 60 nm-wide contact between the mobile biasing probe and a metal-based sample. The structure of the contact has been resolved with high spatial resolution.
EditRelated Products
 |
Biasing HolderSee MoreWire-bonded samples to investigate working devices |
 |
Heating + Biasing HolderSee MoreTransport measurements at different temperatures |
 |
Cryo-Biasing Holder See MoreElectrical biasing of cryo-cooled samples |
 |
Air-Free Transfer Biasing Holder See MoreAir-free sample transfer to the TEM |
Software
Hummingbird Scientific’s graphical user interface features an intuitive fine movement control panel that facilitates and expedites the probe-sample contact process. Functions for varying the fine motion direction and steep size are available, and any parasitic motion in the axes can be compensated with an integrated compensation algorithm. The user can concentrate on the experiment—not on making the contact. The in-situ TEM biasing manipulator platform comes with and integrated voltage source meter supporting electrical measurements, data plotting, and data recording.
EditBiasing composite nanostructures
Researchers at the University of Houston and the Singapore University of Technology and Design made a silkworm cocoon-like silicon battery electrode using a non-invasive sacrificial template method and studied their electronic properties with Hummingbird Scientific’s TEM Biasing Manipulator sample holder. The researchers assembled an electrochemical cell with composites of nitrogen-doped carbon (NC) and porous silicon nanorods (NRs) affixed to a 3 mm half Cu grid and Li/Li2O lithium source/electrolyte attached to the mobile probe. The lithiation process is achieved by contacting sample and probe and biasing the probe with a negative bias.
Reference: Hui Ying Yang et al. Green Fabrication of Silkworm Cocoon-like Silicon-Based Composite for High-Performance Li-Ion Batteries. ACS Nano (2017).
Copyright © 2017 by American Chemical Society
Edit
Image copyright © 2017 American Chemical Society Probe Movement—Step Size Control
This example shows how the probe’s fine movement of Hummingbird’s Scientific biasing manipulator sample holder, can be controlled with high precision in space (X axis in this case) and with different step sizes with just a mouse click. Having different step sizes one click away facilities the probe approach before contacting the sample.
Edit
| Nikhilendra Singh, James Horwath, Timothy Arthur, Daan Hein Alsem, Eric Stach. “Using Operando Electrochemical TEM as Part of a Correlative Approach to Characterize Failure Modes in Solid-State Energy Storage Devices.” Microscopy & Microanalysis (2020) | Abstract |
| Eric Stach, James Horwath, Nikhilendra Singh, Timothy Arthur, Daan Hein Alsem, Norman Salmon. “Understanding the Relationship Between Air Exposure, Electron Dose and Beam Damage in Solid Electrolyte Materials.” Microscopy & Microanalysis (2020) | Abstract |
| Nikhilendra Singh, James Horwath, Alexandre Foucher, Timothy S. Arthur, Julio A. Rodriguez Manzo, Daan Hein Alsem, and Eric Stach. “Operando Electrichemical TEM of Solid-State Energy Storage Materials Using a Probe-Based Biasing Holder.” Microscopy & Microanalysis (2019) | Abstract |
| Julio A. Rodriguez Manzo, Daan Hein Alsem, Norman J. Salmon and David Cooper. “Good Contacts for Quantitative In-Situ TEM Biasing Experiments with Movable Probes.” Microscopy & Microanalysis (2018) | Abstract |
| Fei-Hu Du, Yizhou Ni, Ye Wang, Dong Wang, Qi Ge, Shuo Chen, and Hui Ying Yang. “Green Fabrication of Silkworm Cocoon-like Silicon-Based Composite for High-Performance Li-Ion Batteries,” ACS Nano (2017) | Abstract |
| Z. Yanga, J. Suna, Y. Nia, Z. Zhaob, J. Baob, S. Chen. “Facile synthesis and in situ transmission electron microscopy investigation of a highly stable Sb2Te3/C nanocomposite for sodium-ion batteries,” Energy Storage Materials (2017) | Abstract |
| C.M. Wang, W. Xu, J. Liu, D.W. Choi, B. Arey, L.V. Saraf, J.G. Zhang, Z.G. Zhang, S. Thevuthasan, D.R. Baer, and N. Salmon. ”In-situ transmission electron microscopy and spectroscopy studies of interfaces in Li ion batteries: Challenges and Opportunities,” Journal of Materials Research (2010) | Abstract |
| A.N. Chiaramonti, L.J. Thompson, W.F. Egelhoff, B.C. Kabius , A.K. Petford-Long. ”In-situ TEM studies of local transport and structure in nanoscale multilayer films,” Ultramicroscopy (2008) | Abstract |
Read More