| 1600 Series | |
| Tilt Range | ±45° depending on microscope and pole piece |
| Number of Electrical Contacts | 6, 8, or 9 * |
| Contact Type | Flexible wirebond contacts or fixed spring contact |
| Carrier | Removable Sample Carrier |
| Carrier Compatibility | Any Standard TEM Sample Supports |
| Sample Size | Fits up to 3 x 6mm samples |
| Wiring | Standard or low-noise shielded |
| TEM Compatibility | TFS/FEI, JEOL, Hitachi, Zeiss |
Overview
Hummingbird Scientific’s in-situ electrical biasing holder allows researchers to investigate the electrical response of materials inside the transmission electron microscope. The standard biasing holder has a removable chip carrier that accommodates a wide range of TEM sample geometries. This design allows convenient sample preparation outside the holder and is compatible with all of Hummingbird Scientific’s membrane substrates. Low-noise wiring ensures accurate measurements.
Sample Applications
- Correlating the electrical properties of nanoscale material and microstructures
- Studying the relationship between material defect populations and electrical responses
- Electromigration studies
- Operating microelectomechanical systems (MEMS) based mechanical testing devices
- In-situ testing of solid-state energy devices
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Board ContactThis contact configuration features a removable, reusable sample carrier which allows researchers to prepare the sample directly on the board. |
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Direct Chip ContactThis contact configuration features a single chip that is directly inserted into the holder via a proprietary connector with up to 9 electrical contacts. |
Options
The 1600-series holder features a range of special options:
- Custom-designed sample carriers to fit almost any TEM sample geometry
- Low-noise, individually-shielded cabling option for pA-range current measurements.
- Keithley 2400 SMU
Related Products
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Biasing Manipulator HolderSee MoreOn-site electrical contacts with mobile probe |
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MEMS Biasing + Heating HolderSee MoreHigh temperature transport measurements—phase changes |
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Cryo-Biasing Holder See MoreElectrical biasing of cryo-cooled samples |
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Air-Free Transfer Biasing Holder See MoreAir-free sample transfer to the TEM |
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Temperature mapping on the nanoscale
Microelectronic devices can be simultaneously seen and tested with a biasing holder—taking advantage of the TEM’s analytical toolbox, like in this example, where the in-situ TEM biasing holder and EELS are used to capture changes in temperature. A team led by UCLA demonstrate a noncontact thermometric technique to measure bulk temperatures with nanometer-scale spatial resolution using plasmons.
Reference: B.C. Regan et al. Nanoscale temperature mapping in operating microelectronic devices. Science (2015). Abstract
Copyright © 2016 by the American Association for the Advancement of Science
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Joule heating and EELS spectrum of Al device. Image copyright © 2016 by the American Association for the Advancement of Science
Using our electrical biasing holder, researchers at Penn State have demonstrated the room temperature dislocation-based plasticity and tremendous flaw tolerance of TiN film, which in bulk form is a brittle material. TiN loading was conducted using a MEMS device containing electro-thermal actuators. The researchers surmise that room-temperature dislocation activities resulted from the nucleation of pre-existing dislocations, which resulted from residual compressive stresses developed during deposition. As a result, the TiN films were tougher than the Ti films in the tested multilayers. The movie shows the dislocation movement at the crack tip following loading at room temperature.
Reference: S. Kumar, D.E. Wolfe, M.A Haque. “Dislocation shielding and flaw tolerance in titanium nitride,” International Journal of Plasticity 27:5 (2011) pp. 739–747 . Abstract
Movie copyright © 2010, Elsevier Ltd. All rights reserved.
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| S. Kumar, D. Zhuo, D.E. Wolfe, A. Eades, M.A. Haque. “Length-Scale Effects on Fracture of Multilayers,” Scripta Materialia (2010) | Abstract |
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