One sample on one tip:  using our TEM tomography holder system in combination with a Focus Ion Beam (FIB) and Atom Probe (AP), researchers have a comprehensive, cross-correlative view for 3D sample reconstruction at the atomic and nano scale.  The sample is first sectioned out to the required size and shape using the FIB.  The sample can then be left on the same tip and transferred to the TEM for final shape verification and tilt-series acquisition before being placed in the Atom Probe for final analysis.