Hummingbird Scientific’s biasing-manipulator TEM holder’s movable biasing probe can be use to electrically contact 2D materials’ edges at specific locations with high spatial resolution. In this way, potential differences and electrical currents can be induced in the material locally. This examples shows a TEM image of contact between a metal probe of the biasing-manipulator TEM holder and the edge of a few-layers graphene sample.
Image courtesy of Dr. Yan Cheng from the Shanghai Institute of Microsystem and Information Technology.