Hummingbird Scientific’s in-situ Biasing + Heating sample holder is now available for SEM and X-Ray.

Our new additions will allow multimodal analysis for users to heat and/or electrically bias their sample inside the TEM, SEM or Synchrotron X-Ray.

The key advantage lies in the ability to perform comprehensive, cross-correlative analysis of a single sample. By integrating heating and electrical biasing capabilities, researchers can investigate dynamic processes under real-world conditions across different imaging systems.

This combination allows scientists to correlate structural, surface, and chemical data, leading to more robust insights into the behavior of materials and devices.