Correlate structural, chemical, and electrical changes with simultaneous closed-loop MEMS heating above 1000 °C and electrical biasing during in-situ synchrotron X-ray experiments

X-ray MEMS Heating + Biasing Sample Holder

The Hummingbird Scientific X-ray MEMS Heating + Biasing Sample Holder enables simultaneous high-temperature heating and electrical biasing during in-situ X-ray microscopy and spectroscopy experiments. Designed for researchers in semiconductor devices, energy storage, catalysis, materials science, nanotechnology, and electronics, it supports investigations of phase transformations, electrical transport, electromigration, nanoscale diffusion, device failure, battery cycling, and catalyst activation. By correlating thermal and electrical stimuli with structural, chemical, and electrical changes, researchers can reveal the mechanisms governing material performance and degradation under realistic operating conditions.

Hummingbird Advantages:

  • Screw-free direct MEMS chip insertion for fast, reproducible sample loading.
  • Closed-loop MEMS heating from room temperature to above 1000 °C with integrated temperature sensing.
  • Nine direct-chip electrical contacts for simultaneous electrical biasing and electrical measurements.
  • Supports diverse experiments with FIB lift-out chips, multiple chip electrode materials and geometries, and custom MEMS chip designs.
  • Integrates seamlessly with your X-ray microscope or beamline using custom-fitted stage hardware and user-replaceable electrical cabling for easy maintenance
  • Compatible with TEM, SEM, and X-ray microscopy workflows using cross-platform microfabricated chips.
  • Designed for X-ray absorption spectroscopy (XAS), scanning transmission X-ray microscopy (STXM), transmission X-ray microscopy (TXM), X-ray fluorescence (XRF), X-ray diffraction (XRD), ptychography, coherent diffraction imaging (CDI), and other synchrotron techniques.
Technical Specs
1590 Series – X-ray
Electrical Contacts
9
Contact Type
Direct chip contact
Max Operating Temperature
>1000 °C
Settled Resolution at 1000 °C
Up to X-ray microscope resolution
Temperature Stability
100+ h
Temperature Measurement
4-point resistance sensing
Sample Characterization
Compatible with a variety of X-ray techniques
Beamline Compatibility
Custom integration possible for all endstation chambers, optimized for high-resolution XAS, STXM, and ptychography beamlines where high vacuum chambers are required

How it Works

The X-ray MEMS Heating + Biasing Sample Holder combines Hummingbird Scientific's in-house microfabricated MEMS chips, direct electrical contacts, and closed-loop temperature control to create a stable platform for simultaneous in-situ heating and electrical biasing inside the X-ray microscope or beamline. Samples are mounted directly onto a MEMS chip and inserted into the holder using a screw-free loading mechanism, enabling fast, reproducible experiment setup.

During operation, the MEMS microheater delivers temperatures up to above 1000 °C, while on-chip 4-point resistance sensing enables closed-loop temperature control for stable real-time imaging and analysis. Heating + Biasing MEMS chips support simultaneous thermal and electrical stimulation, while biasing MEMS chips dedicate all nine contacts to electrical measurements when heating is not required.

Correlate structural, chemical, and electrical changes during in-situ synchrotron X-ray experiments with >1000 °C closed-loop MEMS heating and electrical biasing with 9-electrical contacts.

Key Features and Capabilities

Screw-Free Direct Chip Insertion
Screw-Free Direct Chip Insertion

Load MEMS chips quickly with reliable electrical contact and simplified experiment setup

Nine Low-Noise Electrical Contacts
Nine Low-Noise Electrical Contacts

Perform low-noise in-situ electrical measurements with nine direct chip electrical contacts and individually shielded coaxial cables

Closed-Loop MEMS Heating Above 1000 °C
Closed-Loop MEMS Heating Above 1000 °C

Achieve stable high-temperature experiments with rapid MEMS heating and precise temperature control alonsgide concurrent biasing

60+ In-Stock X-ray Heating and Biasing Chip Configurations
60+ In-Stock X-ray Heating and Biasing Chip Configurations

Keep experiments moving with in-stock MEMS chips for heating, electrical biasing, and advanced in-situ X-ray characterization

Custom X-ray Microscope Integration
Custom X-ray Microscope Integration

Configure the holder for seamless integration with synchrotron beamlines and laboratory X-ray microscopy systems

Multimodal Characterization
Multimodal Characterization

Correlate heating, electrical biasing, and imaging data across TEM, SEM, and X-ray microscopy platforms

Software

Spend less time managing equipment and more time generating results. Hummingbird Control Software provides intuitive control of heating and biasing functions, including temperature set points, closed-loop heating behavior, and voltage sweep workflows when configured with the system.

Hummingbird Connect™ can support the broader software strategy by connecting holder operation, microscope context, imaging workflows, and experiment metadata. Together, these tools help improve setup, reproducibility, experiment organization, and long-term usability for in-situ heating and biasing workflows inside an X-ray microscope or beamline.

Built on Engineering Excellence

Hummingbird Scientific designs, machines, assembles, tests, and services its products in-house. Our integrated in-house engineering, precision manufacturing, microfabrication, software development, applications, and service teams enable rapid prototyping and iteration, custom modifications, and direct technical support throughout the life of the instrument. This vertically integrated approach allows researchers to adapt experimental platforms to unique scientific requirements while maintaining the performance and reliability required for advanced in-situ microscopy experiments.

The X-ray MEMS Heating + Biasing Sample Holder reflects this engineering approach by combining MEMS-based heating, electrical biasing, and integrated holder, chip, and controller technologies into a unified platform for reproducible operando in-situ X-ray microscopy and spectroscopy experiments and advanced materials characterization.

Need something unique? Our engineers can customize existing products or develop new solutions to support specialized MEMS chip designs, electrical configurations, sample geometries, and emerging research challenges.

Frequently Asked Questions

What is an X-ray MEMS Heating + Biasing Sample Holder?
What is the X-ray MEMS Heating + Biasing Sample Holder used for?
How many electrical contacts does the X-ray MEMS Heating + Biasing Sample Holder provide?
Why use MEMS-based heating for in-situ synchrotron X-ray experiments?
Can the X-ray MEMS Heating + Biasing Sample Holder be customized for specialized experimental requirements?
How easy is it to set up and run in-situ X-ray heating and biasing experiments?
What advantages does the X-ray MEMS Heating + Biasing MEMS chip platform provide?
Is the X-ray MEMS Heating + Biasing Sample Holder compatible with my X-ray microscope or beamline?
X-ray MEMS Heating + Biasing
Technical Specs
1590 Series – X-ray
Electrical Contacts
9
Contact Type
Direct chip contact
Max Operating Temperature
>1000 °C
Settled Resolution at 1000 °C
Up to X-ray microscope resolution
Temperature Stability
100+ h
Temperature Measurement
4-point resistance sensing
Sample Characterization
Compatible with a variety of X-ray techniques
Beamline Compatibility
Custom integration possible for all endstation chambers, optimized for high-resolution XAS, STXM, and ptychography beamlines where high vacuum chambers are required
Instrument Type
X-ray
Full Product Information
Product Specifications
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