X-Ray MEMS Heating + Biasing

High Temperature, 9-Contact Biasing and Heating

Technical Specs

1590 Series – X-Ray
Electrical Contacts 9*
Contact Type Direct chip contact
Max Operating Temperature >1000°C
Settled Resolution at 1000°C Up to XRay Microscope resolution
Temperature Stability 100+ hours
Temperature Measurement 4-point resistance sensing
Sample Characterization Compatible with a variety of X-Ray techniques
Synchrotron Compatibility Custom integration*

* Contact us for Custom Configurations

Features

Cross-Correlative

Hummingbird Scientific’s in-situ Biasing + Heating sample holder is now available for SEM and X-Ray.

Our new additions will allow multimodal analysis for users to heat and/or electrically bias their sample inside the TEM, SEM or Synchrotron X-Ray.

The key advantage lies in the ability to perform comprehensive, cross-correlative analysis of a single sample. By integrating heating and electrical biasing capabilities, researchers can investigate dynamic processes under real-world conditions across different imaging systems.

This combination allows scientists to correlate structural, surface, and chemical data, leading to more robust insights into the behavior of materials and devices.

Edit

Customization & Service