X-Ray MEMS Heating + Biasing
1590 Series – X-Ray | |
Electrical Contacts | 9* |
Contact Type | Direct chip contact |
Max Operating Temperature | >1000°C |
Settled Resolution at 1000°C | Up to XRay Microscope resolution |
Temperature Stability | 100+ hours |
Temperature Measurement | 4-point resistance sensing |
Sample Characterization | Compatible with a variety of X-Ray techniques |
Synchrotron Compatibility | Custom integration* |
Hummingbird Scientific’s in-situ Biasing + Heating sample holder is now available for SEM and X-Ray.
Our new additions will allow multimodal analysis for users to heat and/or electrically bias their sample inside the TEM, SEM or Synchrotron X-Ray.
The key advantage lies in the ability to perform comprehensive, cross-correlative analysis of a single sample. By integrating heating and electrical biasing capabilities, researchers can investigate dynamic processes under real-world conditions across different imaging systems.
This combination allows scientists to correlate structural, surface, and chemical data, leading to more robust insights into the behavior of materials and devices.
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