Electrical BiasingSelected Publications

Nathanael Jöhrmann, Steffen Hartmann, Kiran Jacob, Jens Bonitz, Kathrine E. MacArthur, Sascha Hermann, Stefan E. Schulz, Bernhard Wunderle. “A test device for in situ TEM investigations on failure behaviour of carbon nanotubes embedded in metals under tensile load,” 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (2017) Abstract
J.J. Lodico, E.R. White, W.A. Hubbard, E. Garcia, B. Parks, B. Zutter, B.C. Regan. In-Situ Scanning Transmission Electron Microscopy (STEM) of Individual Electrochemical Intercalation Events in Graphite,” Microscopy and Microanalysis (2015)  Abstract
M.L. Taheri. Toward Deterministic Switching in Ferroelectric Systems: Insight Gained from In-Situ TEM,” Microscopy and Microanalysis (2015)   Abstract
M.-S. Hsiao, Y. Yuan, C. Grabowski, A. Nie, R. Shabazian-Yassar, L.F. Drummy.In-Situ TEM Characterization of Nanostructured Dielectrics,” Microscopy and Microanalysis (2015)   Abstract
W.A. Hubbard, E.R. White, A. Kerelsky, G. Jasmin, J. Lodico. Time-Resolved Imaging of Electrochemical Switching in Nanoscale Resistive Memory Elements,” Microscopy and Microanalysis (2015)   Abstract
B.C. Regan, W.A. Hubbard, E.R. White, R. Dhall, S.B. Cronin, S. Aloni, M. Mecklenburg. Introduction to Plasmon Energy Expansion Thermometry,” Microscopy and Microanalysis (2015)  Abstract
M.H. Mecklenburg, W.A. Hubbard, E.R. White, R. Dhall, S. Cronin, S. Aloni, B.C. Regan. Applications of Plasmon Energy Expansion Thermometry,” Microscopy and Microanalysis (2015)  Abstract
M. Mecklenburg, W. A. Hubbard,E. R. White, Rohan Dhall, S. B. Cronin, S. Aloni, and B. C. ReganNanoscale temperature mapping in operating microelectronic devices, Science (2015) Abstract
M. Puster, J.A. Rodríguez-Manzo, A. Balan, M. Drndić. “Toward Sensitive Graphene Nanoribbon-Nanopore Devices by Preventing Electron Beam-Induced Damage,” ACS Nano (2013) Abstract
E. Hosseinan, O.N. Pierron, Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films,” Nanoscale (2013) Abstract
C.R. Winkler, M.L. Jablonski, A.R. Damodaran, K. Jambunathan, L.W. Martin, M.L. Taheri. Accessing Intermediate Ferroelectric Switching Regimes With Time-Resolved Transmission Electron Microscopy, Journal of Applied Physics (2012) Abstract
C.R. Winkler, A.R. Damodaran, J. Karthik, L.W. Martin, M.L. Taheri. Direct Observation of Ferroelectric Domain Switching in Varying Electric Field Regimes Using In-Situ TEM,” Micron (2012) Abstract
S. Kumar, D.E. Wolfe, M.A. Haque. “Dislocation Shielding and Flaw Tolerance in Titanium Nitride,” International Journal of Plasticity (2011) Abstract
S. Kumar, D. Zhuo, D.E. Wolfe, A. Eades, M.A. Haque. “Length-Scale Effects on Fracture of Multilayers,” Scripta Materialia (2010) Abstract
C.M. Wang, W. Xu, J. Liu, D.W. Choi, B. Arey, L.V. Saraf, J.G. Zhang, Z.G. Yang, S. Thevuthasan, D.R. Baer, N. Salmon. “In-situ transmission electron microscopy and spectroscopy studies of interfaces in Li ion batteries: Challenges and opportunities,” Journal of Materials Research(2010) Abstract
S. Kumar, M.A. Haque. “Fracture Testing of Nanoscale Thin Films inside the Transmission Electron Microscope,” International Journal of Applied Mechanics (2010) Abstract
D.T. Schoen, S. Meister, H. Peng, C. Chan, Y. Yangb, Y. Cuia. “Phase transformations in one-dimensional materials: applications in electronics and energy sciences,” Journal of Materials Chemistry (2009) Abstract
H. Minoda, K. Hatano, H. Yazawa. “Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope,” Review of Scientific Instruments  (2009) Abstract
S. Kumar, M.A. Haque, H. Gao. “Notch-Insensitive Fracture in Nanoscale Thin Films,” Applied Physics Letters (2009) Abstract
S. Meister, D.T. Schoen, M.A. Topinka, A.M. Minor, Y. Cui.  ”Void Formation Induced Electrical Switching in Phase-Change Nanowires,”Nano Letters (2008) Abstract
H. Peng, C. Xie, D.T. Schoen, and Y. Cui. “Large Anisotropy of Electrical Properties in Layer-Structured In2Se3 Nanowires,” Nano Letters (2008) Abstract