Electrical BiasingSelected Publications

Nathanael Jöhrmann, Steffen Hartmann, Kiran Jacob, Jens Bonitz, Kathrine E. MacArthur, Sascha Hermann, Stefan E. Schulz, Bernhard Wunderle. “A test device for in situ TEM investigations on failure behaviour of carbon nanotubes embedded in metals under tensile load,” 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (2017) Abstract
E. Hosseinan, O.N. Pierron, Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films,” Nanoscale, Issue 24 2013, 5, 12532-12541 Abstract
J.J. Lodico, E.R. White, W.A. Hubbard, E. Garcia, B. Parks, B. Zutter, B.C. Regan. In-Situ Scanning Transmission Electron Microscopy (STEM) of Individual Electrochemical Intercalculation Events in Graphite,” Microscopy and Microanalysis Meeting (2015)
M.L. Taheri. Toward Deterministic Switching in Ferroelectric Systems: Insight Gained from In-Situ TEM,” Microscopy and Microanalysis Meeting (2015)
M.-S. Hsiao, Y. Yuan, C. Grabowski, A. Nie, R. Shabazian-Yassar, L.F. Drummy.In-Situ TEM Characterization of Nanostructured Dielectrics,” Microscopy and Microanalysis Meeting (2015)
W.A. Hubbard, E.R. White, A. Kerelsky, G. Jasmin, J. Lodico. Time-Resolved Imaging of Electrochemical Switching in Nanoscale Resistive Memory Elements,” Microscopy and Microanalysis Meeting (2015)
B.C. Regan, W.A. Hubbard, E.R. White, R. Dhall, S.B. Cronin, S. Aloni, M. Mecklenburg. Introduction to Plasmon Energy Expansion Thermometry,” Microscopy and Microanalysis Meeting (2015)
M.H. Mecklenburg, W.A. Hubbard, E.R. White, R. Dhall, S. Cronin, S. Aloni, B.C. Regan. Applications of Plasmon Energy Expansion Thermometry,” Microscopy and Microanalysis Meeting (2015)
M. Mecklenburg, W. A. Hubbard,E. R. White, Rohan Dhall, S. B. Cronin, S. Aloni, and B. C. ReganNanoscale temperature mapping in operating microelectronic devices, Science vol. 347 iss. 6222, (2015) pp. 629-632. Abstract
H. Peng, C. Xie, D.T. Schoen, and Y. Cui. Large Anisotropy of Electrical Properties in Layer-Structured In2SeNanowires,” Nano Letters 8:5 (2008) pp. 15111516 Abstract
M. Puster, J.A. Rodríguez-Manzo, A. Balan, M. Drndić. “Toward Sensitive Graphene Nanoribbon-Nanopore Devices by Preventing Electron Beam-Induced Damage,” ACS Nano 7:12 (2013) pp. 11283–11289 Abstract
C.R. Winkler, M.L. Jablonski, A.R. Damodaran, K. Jambunathan, L.W. Martin, M.L. Taheri. Accessing Intermediate Ferroelectric Switching Regimes With Time-Resolved Transmission Electron Microscopy, J. Applied Physics 112:5 (2012) Abstract
C.R. Winkler, A.R. Damodaran, J. Karthik, L.W. Martin, M.L. Taheri. Direct Observation of Ferroelectric Domain Switching in Varying Electric Field Regimes Using In-Situ TEM, Micron 43:11 (2012) pp. 1121–1126 Abstract
S. Kumar, D.E. Wolfe, M.A. Haque. “Dislocation Shielding and Flaw Tolerance in Titanium Nitride”, International Journal of Plasticity 27:5 (2011) pp. 739–747 Abstract
S. Kumar, D. Zhuo, D.E. Wolfe, A. Eades, M.A. Haque. “Length-Scale Effects on Fracture of Multilayers,” Scripta Materialia 63:2 (2010) pp. 196–199 Abstract
C.M. Wang, W. Xu, J. Liu, D.W. Choi, B. Arey, L.V. Saraf, J.G. Zhang, Z.G. Yang, S. Thevuthasan, D.R. Baer, N. Salmon. “In-situ transmission electron microscopy and spectroscopy studies of interfaces in Li ion batteries: Challenges and opportunities,” J. Mater. Res. 25:8 (2010) pp. 1541–1547. Abstract
S. Kumar, M.A. Haque. “Fracture Testing of Nanoscale Thin Films inside the Transmission Electron Microscope,” International Journal of Applied Mechanics 2:4 (2010) pp. 745 Abstract
D.T. Schoen, S. Meister, H. Peng, C. Chan, Y. Yangb, Y. Cuia. “Phase transformations in one-dimensional materials: applications in electronics and energy sciences,” Journal of Materials Chemistry 19 (2009) pp. 5879–5890 Abstract
H. Minoda, K. Hatano, H. Yazawa. “Development of a surface conductivity measurement system for ultrahigh vacuum transmission electron microscope,” Rev. Sci. Instruments 80 (2009) pp. 113702 Abstract
S. Kumar, M.A. Haque, H. Gao. “Notch-Insensitive Fracture in Nanoscale Thin Films,” Applied Physics Letters 94:25 (2009) Abstract
S. Meister, D.T. Schoen, M.A. Topinka, A.M. Minor, Y. Cui.  ”Void Formation Induced Electrical Switching in Phase-Change Nanowires,”Nano Letters 8:12 (2008) pp. 4562–4567 Abstract
H. Peng, C. Xie, D.T. Schoen, and Y. Cui. “Large Anisotropy of Electrical Properties in Layer-Structured In2Se3 Nanowires,” Nano Letters 8:5 (2008) pp. 15111516 Abstract