Category: News Post

Collaborative Hummingbird Scientific in-situ microscopy study of Li battery electrode materials in the news
Read a features news article on the Lawrence Berkeley National Laboratory website about the Hummingb...Read More
Hummingbird at the MRS Fall 2016 Meeting and Conference
Visit us at Booth 1004 DATES: Nov. 28th–Dec. 2nd, 2016 EXHIBIT HOURS: Tuesday, Novem...Read More
Operando liquid-electrochemical microscopy reveals origin of Li charging and discharging of battery primary particles
Hummingbird Scientific has supported and collaborated in a study led by Stanford University, con...Read More
EMC Conference 2016
Visit us at Booth 47c Congress Dates:  August 28th-2nd September, 2016 Booth Location: Booth...Read More
In-situ Investigation of the Formation and Metastability of Formamidinium Lead Tri-iodide Perovskite Solar Cells
  Researchers at National Renewable Energy Laboratory, Los Alamos National Laboratory, U...Read More
Congratulations to Dr. Chongmin Wang for JMR Paper of the Year Award for his review on liquid cell TEM
Dr. Chongmin Wang (Pacific Northwest National Lab) receives the Journal of Materials Research paper ...Read More
NEW In-situ TEM Liquid Holder System
NEW In-situ TEM Liquid Holder System Hummingbird Scientific's first award winning in-situ TEM li...Read More
Control of Electron Beam-Induced Au Nanocrystal Growth Kinetics through Solution Chemistry
Researchers at the University of California Los Angeles, IBM, and the University of Pennsylvania...Read More
Operando Gas Cell TEM and X-Ray Microscopy Enables Mapping of Catalytic Reactions in Real Time
Researchers at Brookhaven National Laboratory have used Hummingbird Scientific in-situ gas cell TEM...Read More
The Origins of a Mineral
In a study published recently in Science, researchers at Lawrence Berkeley National Laboratory (...Read More
Journal of Materials Research publishes review article on in-situ TEM of battery materials
The February 14 issue of Journal of Materials Research  has a special focus on In-situ and Oper...Read More
In-Situ TEM reveals local temperature measurement in nano-scale electrical devices
Temperature changes in electronic devices can have a detrimental effect on device reliability. R...Read More