Technical Specs

Mag Holder Side view1000
1700 Series
Tilt Range Up to ±45° depending on objective pole
Sample Size
In-plane applied magnetic flux density
Up to 900 Gauss, depending on microscope and pole piece
Electron imaging
From -300 Oe to +300 Oe applied field
Beam Deflection
Integrated passive magnetic compensation
TEM Compatibility FEI, JEOL, Hitachi

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Featured Research

Magnetic Thin Film Materials

In combination with magnetic TEM imaging techniques (e.g. Lorenz TEM), the in-situ application of magnetic fields to magnetic materials allows researchers to study nano-scale magnetic behavior and directly correlate material microstructure with magnetic domain structure.

Right: Fe-Pd alloy film showing changes to magnetic domain structure as a function of the in-plane magnetic field applied using magnetizing holder. Magnetic domain walls appear as white and black line pairs. Marc De Graef, Carnegie Mellon University; images courtesy of Amanda Petford-Long, Argonne National Laboratory. (ANL, a U.S. Dept. of Energy, Office of Science Laboratory, is operated under Contract No. DE-AC02-06CH11357).

Reference: M. De Graef, “Recent Progress in Lorentz Transmission Electron Microscopy, EPJB Condensed Matter and Complex Systems, ESOMAT 2009, 01002, 2009 (Section 2). Abstract

Copyright © 2009, M. De Graef

Magnetic Thin Film Materials Research showing change in magnetic domain structure

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Selected Publications

A. Budruk, C. Phatak, A.K. Petford-Long, M. De Graef. “In-situ Lorentz TEM magnetization studies on a Fe-Pd-Co martensitic alloy,” Acta Materialia 59:17 (2011) pp. 6646‒6657 Abstract
A. Budruk, C. Phatak, A.K. Petford-Long, M. De Graef, “In-situ Lorentz magnetization study of a Ni-Mn-Ga ferromagnetic shape memory alloy,” Acta Materialia 59:12 (2011) pp. 4895‒4906 Abstract
M. De Graef. “Recent Progress in Lorentz Transmission Electron Microscopy,”  8th European Symposium on Martensic Transformations (2009), Keynote Lecture Abstract


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