Hummingbird Tomography TEM Sample Holder - Half Grid JEOL with 3d tomographic recontruction

Tomography

Technical Specs

TEM Sample Holder - Atom Probe Cross Correllative Tomography - FEI Model
1000 Series
Removable tips for varying  sample sizes
Single Point Needle, 1mm Grid, 3mm Half-Grid, 3mm Full-Grid
Tilt Range
±90° (dependent on stage limits)
Image Resolution Down to microscope spec
TEM Compatibility FEI, JEOL, Hitachi, Zeiss

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Features

Featured Research

Nano-wire Characterization using TEM Tomography

Researchers at Northwestern University have used Hummingbird Scientific’s tomography holder to characterize Au-catalyzed nano-wires and map the spatial distribution of Au on Si nanowires. Au nanoparticles attached to Si nanowire devices significantly enhance the photocurrent via local surface plasmon excitation of the nano-wire. A complete understanding of nanoscale structure property relationships in such materials requires a 3D perspective with sub-nanometer resolution.

Figure Left (b, c): Dark Field STEM images of a nanowire tilted at different angles. Scale bar is 50 nm.

Figure Right (d): 3D reconstruction of Au particle distribution on Si nano-wires.

Reference: J. Wu, S. Padalkar, S. Xie, E.R. Hemesath, J. Cheng, G. Liu, A. Yan, J.G. Connell, E. Nakazawa, X. Zhang, L.J. Lauhon, V.P. Dravid. “Electron Tomography of Au-Catalyzed Semiconductor Nanowires,” Journal of Physical Chemistry C 117:2 (2013) pp.1059‒1063. Abstract

Copyright © 2012, American Chemical Society

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Single Tilt Tomography Research

Video Spotlight

Tilt series Z-contrast STEM images of a Ge nanowire after alignment, taken using Hummingbird Scientific’s Tomography holder. The nano-wire is approximately 150nm in diameter.

Reference: J. Wu, S. Padalkar, S. Xie, E.R. Hemesath, J. Cheng, G. Liu, A. Yan, J.G. Connell, E. Nakazawa, X. Zhang, L.J. Lauhon, V.P. Dravid. “Electron Tomography of Au-Catalyzed Semiconductor Nanowires,” Journal of Physical Chemistry C 117:2 (2013) pp.1059‒1063. Abstract

Copyright © 2012, American Chemical Society

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Customization & Service

Selected Publications

Surya S. Rout, Philipp R. Heck, Dieter Isheim, Thomas Stephan, Nestor J. Zaluzec, Dean J. Miller, Andrew M. Davis, and David N. Seid. “Atom-probe tomography and transmission electron microscopy of the kamacite–taenite interface in the fast-cooled Bristol IVA iron meteorite,” Meteoritics & Planetary Science (2017) Abstract
Peter Bai, Sui Yang, Wei Bao, Joseph Kao, Kari Thorkelsson, Miquel Salmeron, Xiang Zhang, and Ting Xu. “Diversifying Nanoparticle Assemblies in Supramolecule Nanocomposites Via Cylindrical Confinement,” Nano Letters (2017) Abstract
T. Segal-Peretz, J. Winterstein, J. Ren, M. Biswas, J.A. Liddle, J.W. Elam, L.E. Ocola, R.N. S. Divan, N. Zaluzec, and P.F. Nealey.  “Metrology of DSA process using TEM tomography,” Proc. SPIE (2015)  Abstract
T. Segal-Peretz, J. Winterstein, M. Biswas, J.A. Liddle, Jeffrey W. Elam, N. J. Zaluzec, P.F. Nealey.  “Staining Block Copolymers using Sequential Infiltration Synthesis for High Contrast Imaging and STEM tomography,” Microscopy and Microanalysis (2015).  Abstract
S. Zhang, A. Petford-Long, C. Phatak. “Three-Dimensional Magnetic Field Reconstruction of Artificial Skyrmion Hetrostructures,” Microscopy and Microanalysis (2015)  Abstract
A. Stokes, M. Al-Jassim, D. Diercks, B. Gorman, B. Egaas, and Brian Gorman.  “Targeting Grain Boundaries for Structural and Chemical Analysis Using Correlative EBSD, TEM, and APT,” Microscopy & Microanalysis (2015)  Abstract
A. K. Shukla, P. Ercius, A. R. S. Gautam, J. Cabana, and U. Dahmen “Electron Tomography Analysis of Reaction Path during Formation of Nanoporous NiO by Solid State Decomposition.” Crystal Growth & Design (2014) Abstract
M. Ge, Y. Lu, P. Ercius, J. Rong, X. Fang, M. Mecklenburg, and C. Zhou “Large-Scale Fabrication, 3D Tomography, and Lithium-Ion Battery Application of Porous Silicon” Nano Letters (2014) Abstract
A. Devaraj, S. Nag, R. Banerjee. “Alpha Phase Precipitation from Phase-separated Beta Phase in a Model Ti–Mo–Al Alloy Studied by Direct Coupling of Transmission Electron Microscopy and Atom Probe Tomography,” Scripta Materialia (2013) Abstract
J. Wu, S. Padalkar, S. Xie, E.R. Hemesath, J. Cheng, G. Liu, A. Yan, J.G. Connell, E. Nakazawa, X. Zhang, L.J. Lauhon, V.P. Dravid. “Electron Tomography of Au-Catalyzed Semiconductor Nanowires,” J. Phys. Chem. C (2013) Abstract
F. I. Allen, P. Ercius, M. A. Modestino, R. A. Segalman, N. P. Balsara, A. M. Minor “Deciphering the three-dimensional morphology of free-standing block copolymer thin films by transmission electron microscopy.” Micron (2013) Abstract
J. Kao, P. Bai, V. P. Chuang, Z. Jiang, P. Ercius, and T. Xu “Nanoparticle Assemblies in Thin Films of Supramolecular Nanocomposites” Nano Letters (2012)
Abstract
Y. Liu, D.K. Schreiber, A.K. Petford-Long, K.Z. Gao. “Three-Dimensional Characterization of Near-Field Transducers by Electron Tomography,” Materials Characterization (2012) Abstract
Kari Thorkelsson, Alexander J. Mastroianni, Peter Ercius, and Ting Xu “Direct Nanorod Assembly Using Block Copolymer-Based Supramolecules” Nano Letters (2012) Abstract
S. Yakovlev, X. Wang, P. Ercius, N. P. Balsara, and K. H. Downing “Direct Imaging of Nanoscale Acidic Clusters in a Polymer Electrolyte Membrane.” Journal of the American Chemical Society (2011)
Abstract
C. Phatak, A.K. Petford-Long, M. De Graef. “Three-Dimensional Study of the Vector Potential of Magnetic Structures,” Physical Review Letters (2010) Abstract
B.P. Gorman, D. Diercks, N. Salmon, E. Stach, G. Amador, C. Hartfield. “Hardware and Techniques for Cross-Correlative TEM and Atom Probe Analysis,” Microscopy Today (2008)  Article
T.F. Kelly, D.J. Larson, K. Thompson, R.L. Alvis, J.H. Bunton, J.D. Olson, and B.P. Gorman. “Atom Probe Tomography of Electronic Materials,”Annual Review of Materials Research (2007) Abstract

 

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