|Range of Motion
| X-axis (coarse, fine)
||±0.5 mm, 50 µm|
| Y-axis (coarse, fine)
||±0.5 mm, 50 µm|
| Z-axis (coarse, fine)
||5 mm, 5 µm|
|Number of Electrical Contacts
||2 (available up to 7)|
|Coarse Stage Positioning Resolution
|Fine Stage Positioning Resolution
||< 1 nm|
|Current Measurement Resolution||Down to 10 pA (depending on measurement equipment)|
|Sample Geometry||3 mm half grid bulk, half grid FIB lift out or half grid membrane samples*|
Hummingbird Scientific’s in-situ TEM Nano-Manipulator Holder enables atomic scale manipulation and electrical testing of materials during concomitant high-resolution imaging. It uses a 3-axis manipulator probe to manipulate and bias the sample. We use a proven combination of coarse and fine scale positioning that provides atomic resolution stability for the sample and probe.Read MoreEdit
How it Works
The manipulation and biasing probe tip in the Nanomanipulator TEM holder can be moved with sub-nanometer accuracy and a millimeter of range in three Cartesian axes. Positioning is done in two stages: coarse and fine. The coarse position is adjusted with ultrafine pitch screws and the fine positioning is piezo adjusted with the included controller and software interface. The probe can be manipulated to make electrical contact with a conductive sample thereby completing a circuit (see Figure).
The system utilizes very low noise internal individual coax cables to optimize electrical measurement accuracy. The holder is setup standard for 3 mm half grid samples, either conventionally prepared bulk samples, FIB lift out samples on lift-out (half) grids or on a membrane chip substrates. Contact us about custom sample mounting solutions.Edit
The Nanomanipulator TEM holder features fine motor control through a software interface. It also includes a built in Source Measurement Unit for electronic experiments. Left: Nano-Manipulator software interface for probe control, biasing settings and IV measurements.
The fine position control for the manipulator is provided via a simple and lightweight software interface. There are options for varying the motion speed, range, and resolution. Any parasitic motion in the axes can be compensated for with a novel compensation algorithm integrated with the software. A joystick or game-controller may also be attached to the host computer and used to manipulate the probe instead of the default on-screen buttons, granting increased flexibility and ease-of-use.
The built in source measurement unit is controlled through the same interface. Alter current or voltage as well as basic signal on-screen with full signal plotting and logging.Edit
Accessories available for your Nano-Manipulator.
- Conventional 3mm Grids
Conduction in nanoscale contacts
Electrical contacts with nanosized interfaces can be formed at will by positioning the movable probe in the required spot, enabling simultaneous recording of the contact’s structural and electronic conduction state.
The interface size, the contact shape and orientation, the material intermixing, all of these parameters can be precisely determined with high spatial resolution, while a bias between sample and probe allows to measure the electronic conductive state of the contact.
The individual coaxial wiring in the holder for each contact gives pA noise levels during these measurements, allowing to measure low currents in non-ohmic contacts.
Unpublished work: Tevis Jacobs, University of Pittsburgh, Siddharth Sood, Daan Hein Alsem, Hummingbird ScientificEdit