Hummingbird Scientific Nano_Manipulator TEM Sample Holder

Nano-Manipulator

Technical Specs

NanoManipulator_Holder_Hummingbird_Scientific_Low Res
1800 Series
Range of Motion
   X-axis (coarse, fine)
±0.5 mm, 50 µm
   Y-axis (coarse, fine)
±0.5 mm, 50 µm
   Z-axis (coarse, fine)
5 mm, 5 µm
Number of Electrical Contacts
2 (available up to 7)
Coarse Stage Positioning Resolution
1 μm
Fine Stage Positioning Resolution
< 1 nm
Wiring Individually Shielded
Current Measurement Resolution Down to 10 pA (depending on measurement equipment)
Sample Geometry 3 mm half grid bulk, half grid FIB lift out or half grid membrane samples*

* Call for Custom Configurations

Features

Application Example

Conduction in nanoscale contacts

Electrical contacts with nanosized interfaces can be formed at will by positioning the movable probe in the required spot, enabling simultaneous recording of the contact’s structural and electronic conduction state.

The interface size, the contact shape and orientation, the material intermixing, all of these parameters can be precisely determined with high spatial resolution, while a bias between sample and probe allows to measure the electronic conductive state of the contact.

The individual coaxial wiring in the holder for each contact gives pA noise levels during these measurements, allowing to measure low currents in non-ohmic contacts.

Unpublished work: Tevis Jacobs, University of Pittsburgh, Siddharth Sood, Daan Hein Alsem, Hummingbird Scientific

Edit
Top panel: probe and sample before and after forming a < 10 nm contact. Bottom panel: (a) metal-metal and (b) metal-semiconductor nanocontacts show clear different electrical properties.
Top panel: probe and sample before and after forming a < 10 nm contact. Bottom panel: (a) metal-metal and (b) metal-semiconductor nanocontacts show clear different electrical properties.

Customization & Service

Selected Publications

A.N. Chiaramonti, L.J. Thompson, W.F. Egelhoff, B.C. Kabius , A.K. Petford-Long. ”In-situ TEM studies of local transport and structure in nanoscale multilayer films,” Ultramicroscopy 108 (2008) pp. 1529–1535 Abstract

 

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