In-situ TEM Biasing Pump-Probe Experiment in a Laser-free GHz Stroboscopic Transmission Electron Microscopy

Researchers at NIST, Brookhaven National Laboratory and Euclid Techlabs recently published their first results with their laser-free stroboscopic TEM. The paper, which was published in Review of Scientific Instruments, shows with a GHz pump-probe experiment of two electrostatic combs in Hummingbird Scientific’s electrical biasing holder that the stroboscopic TEM  system can be used for pump-probe experiments.

To set up the stroboscopic TEM they modified a 300 KeV JEOL TEM to produce GHz pulsed beams up to 12 GHz. They achieved this by using two specially developed pulsers. Because these pulsers are located just below the electron gun (see picture below), it allows the rest of the TEM optics to remain standard. This enables easier integration, as well as allows the TEM to retain its standard continuous beam TEM operation modes.  In the paper they describe the implementation of this concept in the TEM and the practical aspects of performing such an integration.

Electrically active interdigited comb electrodes during the GHz pump-pulse experiment (right) and static biasing (middle) as performed in the stroboscopic TEM (far left) and the TEM biasing holder (top).  Bottom three images © 2020 AIP Publishing LLC

Reference: June W. Lau, Karl B. Schliep, Michael B. Katz, Vikrant J. Gokhale, Jason J. Gorman, Chunguang Jing, Ao Liu, Yubin Zhao, Eric Montgomery, Hyeokmin Choe, Wade Rush, Alexei Kanareykin, Xuewen Fu, and Yimei Zhu, “Laser-free GHz stroboscopic transmission electron microscope: Components, system integration, and practical considerations for pump–probe measurements”,   Rev. Sci. Instrum. 91, 021301 (2020);

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